Publication Data

Venue

Proceedings of the 7th ACM SIGPLAN-SIGSOFT workshop on Program analysis for software tools and engineering, ACM Press, New York, NY, USA (2007), pp. 1-8

Publication Year

2007

Authors

Nathaniel Ayewah, William Pugh, , , YuQian Zhou

BibTeX

   Evaluating Static Analysis Defect Warnings on Production Software

Abstract: Classification of static analysis warnings into false positive, trivial or serious bugs: Experience on Java JDK and Google codebase